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Xingde Li elected as SPIE Fellow

January 10, 2012
Xingde Li works in his microscope lab.

Dr. Xingde Li has been elected by the International Society for Optics and Photonics (SPIE) as a Fellow of the Society. Dr. Li is one of only 75 new Fellows elected worldwide in 2011. Dr. Li is being recognized for his achievements in optical coherence tomography and nonlinear optical imaging.

SPIE is a large (if not the largest) international society in the area of optics and photonics, with a total of more than 17,000 members over more than 100 countries. Fellows are Members of distinction who have made significant scientific and technical contributions in the multidisciplinary fields of optics, photonics, and imaging. They are honored for their technical achievement, for their service to the general optics community, and to SPIE in particular. More than 900 SPIE members have become Fellows since the Society’s inception in 1955.

Category: Faculty
Associated Faculty: Xingde Li

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